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1

Techniques for SAT-based constrained test pattern generation

Balcarek, Jiri, Fiser, Petr, Schmidt, Jan

Journal:

Microprocessors and Microsystems

Year:

2013

Language:

english

File:

PDF, 1.43 MB

english, 2013

2

The influence of implementation type on dependability parameters

Schmidt, Jan, Fišer, Petr, Balcárek, Jiří

Journal:

Microprocessors and Microsystems

Year:

2013

Language:

english

File:

PDF, 953 KB

english, 2013

3

On don’t cares in test compression

Balcárek, Jiří, Fišer, Petr, Schmidt, Jan

Journal:

Microprocessors and Microsystems

Year:

2014

Language:

english

File:

PDF, 1.62 MB

english, 2014

4

[IEEE 2012 15th Euromicro Conference on Digital System Design (DSD) - Cesme, Izmir, Turkey (2012.09.5-2012.09.8)] 2012 15th Euromicro Conference on Digital System Design - The Influence of Implementation Technology on Dependability Parameters

Schmidt, Jan, Fier, Petr, Balcarek, Jiri

Year:

2012

Language:

english

File:

PDF, 342 KB

english, 2012

5

Medicine and the Law

Balcarek, Jiri, Fiser, Petr, Schmidt, Jan

Journal:

Year:

1948

Language:

english

File:

PDF, 212 KB

english, 1948

6

[IEEE 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD) - Lille, France (2010.09.1-2010.09.3)] 2010 13th Euromicro Conference on Digital System Design: Architectures, Methods and Tools - Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG

Balcarek, Jiri, Fiser, Petr, Schmidt, Jan

Year:

2010

Language:

english

File:

PDF, 391 KB

english, 2010

7

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - PBO-Based Test Compression

Balcarek, Jiri, Fier, Petr, Schmidt, Jan

Year:

2014

Language:

english

File:

PDF, 167 KB

english, 2014

8

[IEEE 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Warsaw, Poland (2014.4.23-2014.4.25)] 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems - Sources of bias in EDA tools and its influence

Fiser, Petr, Schmidt, Jan, Balcarek, Jiri

Year:

2014

Language:

english

File:

PDF, 266 KB

english, 2014

9

[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - On Robustness of EDA Tools

Schmidt, Jan, Fier, Petr, Balcarek, Jiri

Year:

2014

Language:

english

File:

PDF, 892 KB

english, 2014

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